Design of an Ultra-Wideband Low-Noise Amplifier for Spin Wave Readout Circuitry in 65 nm CMOS Technology

We introduce a new approach to measure spin waves on-chip and describe the design of an ultra-wideband Low-Noise Amplifier (LNA) implemented in a readout circuitry for characterization of the spin wave devices. The LNA shows a gain of 22.6 dB in the frequency range between 9.7 GHz and 43.3 GHz. The...

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Bibliographic Details
Main Authors: Meier C
Egel E
Csaba György
Breitkreutz-von Gamm S
Format: Article
Published: 2016
Series:2016 16TH MEDITERRANEAN MICROWAVE SYMPOSIUM (MMS) 16
Subjects:
mtmt:3194618
Online Access:https://publikacio.ppke.hu/1826
Description
Summary:We introduce a new approach to measure spin waves on-chip and describe the design of an ultra-wideband Low-Noise Amplifier (LNA) implemented in a readout circuitry for characterization of the spin wave devices. The LNA shows a gain of 22.6 dB in the frequency range between 9.7 GHz and 43.3 GHz. The minimum Noise Figure (NF) is 5.3 dB at 22.75 GHz. Simulations were performed with 65nm CMOS technology node in Cadence Virtuoso. Estimated power consumption and chip area are 41.62mW and 0.172mm(2), respectively.
ISSN:2157-9822